Samsung Selects Jordan Valley's JVX6200 for On-Line Thin Films Metrology

MIGDAL HA'EMEK, Israel, May 11 /PRNewswire/ -- Jordan Valley Semiconductors
Ltd. announced that Korea-based Samsung Electronics Co. Ltd, has selected the
JVX6200 advanced thin films, in-line metrology system for their next
generation applications in the FEOL and BEOL areas. Jordan Valley's JVX6200
XRR & XRF tool demonstrated great flexibility and ease of use.

"Our evaluation demonstrated that the JVX6200 XRR with the JVXRR analysis
software deliver superb results and outstanding throughput," noted Dr. B.H
Lee, Sr. Manager of Metrology division. at Samsung Electronics Co. Ltd. Dr.
Lee continued: "With the JVX6200, we are able to tighten our process control
even for the most demanding thin films, while enhancing throughput and
flexibility. The JVX6200 improves our productivity and yields."

Samsung's selection of the JVX6200 further enhances our position as the market
leader in X-ray based metrology for the sub-50 nm processes noted Mr. Isaac
Mazor, President and CEO of Jordan Valley Semiconductors. This is another
vote of confidence for our innovative products, designed for the demanding
metrology needs with high throughput, small footprint and low COO, further
mentioned Mr. Mazor. "We look forward to continual support of Samsung's
metrology needs as they evolve."

About the JVX6200 X-ray metrology tool
Jordan Valley's JVX6200 X-ray metrology tool is a multi channel, high
throughput and small footprint, fully fab-automated metrology tool,
specifically built for most advanced production fabs. The JVX6200 is utilized
for advanced process control at the front end of line (FEOL) and back-end of
line (BEOL) applications in fabs worldwide. The JVX6200 X-Ray Reflectometry
(XRR) is a non-contact, non-distractive, surface-sensitive technique that
delivers precise and accurate characterization of thin films and multi-layer
stacks. The XRR technique measures thickness, density and roughness data by
analyzing the reflection vs. angle, and interference patterns of X-rays that
reflect off the interfaces. The JVX6200 XRR analyzes single and multiple thin
films metal and dielectric layers from 1 to 500 nm thick. Jordan Valley's
advanced XRR technology allows measurements on production wafers and offers
superior throughput of over 30 WPH (17 points on 300mm wafer).

About Jordan Valley
Jordan Valley Semiconductors Ltd. is a worldwide leader in the development,
manufacture and selling thin films metrology tools for most advanced
semiconductor manufacturing processes. We offer a comprehensive family of
solutions based on advanced X-Ray Reflectivity (XRR), X-Ray Fluorescence (XRF)
and High Resolution X-Ray Diffractometry (HRXRD). These tools are fully
automated, production ready and ideal for both blanket and patterned wafers.
Jordan Valley's X-Ray technology enables accurate and precise characterization
of all film types - including single and multi-layer stacks, high k and low k
materials, metals and dielectrics, amorphous, poly-crystal, and single crystal
films. Research and Development, Sales & Headquarters are based in Migdal
Ha'Emek, Israel. Primary manufacturing is based in Migdal Ha'Emek with a
secondary location in Durham, United Kingdom. Demo lab, Sales & Customer
support office is in Austin, Texas, USA. Jordan Valley products are used in
production by leading semiconductor manufacturers worldwide. Jordan Valley's
primary shareholders are Clal Industries and Investments Ltd., Intel Capital,
and Elron Electronic Industries Ltd.

For additional information about Jordan Valley, please visit our web site at:
http://www.jvsemi.com

SOURCE Jordan Valley Semiconductors

Alon Kapel, +972.4 6543666, alon@jordanvalley.com, or Ralph Kippen, SEA sales
manager, +886-933361873, Ralph@jordanvalley.com, both of Jordan Valley
Semiconductors Ltd., or Brenda Ortiz, US Office of Jordan Valley
Semiconductors, Inc., +1-512-832-8470, brendao@jvsemi.com