International Test Conference to Host Annual Event in Austin, Texas, November 3-5,...

International Test Conference to Host Annual Event in Austin, Texas, November
3-5, 2009
ITC, The Cornerstone of TestWeek(TM), Celebrates 40th Conference

WASHINGTON, Sept. 8 /PRNewswire/ -- International Test Conference, the
highlight of the annual Test Week(TM) activities and the leading forum for
electronics test technology, promises to engage and stimulate attendees from
the test and design community with its technical program and exhibits when the
doors open at the 40th annual ITC. Test Week 2009 runs from November 1 - 6 at
the Austin Convention Center in Austin, Texas. ITC's Advance Program and
online registration are available at www.itctestweek.org.

ITC 2009 Abounds with Technical Offerings and Educational Opportunities

ITC, the cornerstone of the Test Week event, is known worldwide for the
strength of its technical program, which attracts many top researchers, and
industry experts who choose ITC to present the results of their work.
Offerings throughout the week incorporate a wide variety of technical
activities targeted at test and design practitioners. This year's
comprehensive program includes formal paper sessions, tutorials, panel
sessions, a lecture series, advanced industrial practices sessions, workshops,
exhibits and a host of professional fringe meetings. A new Career Track,
hosted by IEEE-USA will focus on today's job market, with three sessions to
help engineers expand their career horizons. Taken together, these activities
provide a week-long educational experience for attendees from novice to
expert.

This year, the International Test Conference technical program together with
other Test Week 2009 events will focus on such hot topics as test compression,
power-aware test, advances in delay test, logic diagnosis, silicon debug, and
high-quality test methods. Attendees will also learn more about what's going
on in traditional topics such as analog, mixed-signal, RF, microprocessor test
and DFT -- as well as defects, memory, ATE and board test.

The renowned technical program offers 60 papers throughout 18 sessions, and is
supplemented with a lecture series and Advanced Industrial Practices (AIP)
sessions which present the latest methods and techniques used by industry
leaders in addressing some of today's most important test challenges. This
year's AIP sessions include interesting presentations from the Southwest Test
Workshop, which focuses on wafer- and die-level testing, a session on how test
can be used for yield improvement, and a session on the critical problem of
validating an IC after the first silicon comes back from the fab.

ITC will also continue its tradition of presenting thought-provoking panels
exploring current issues challenging the test practitioner. Beginning on
Monday afternoon with a with a special panel titled 40 Years of Reliable
Computing at Stanford CRC, 6 additional panels will also run on Tuesday,
Wednesday and Thursday on topics including analog test technology, testing of
3-D chips, power faults, physically aware DFT, predictive solutions and
architectural tradeoffs for test, and on how (un) affordable is the cost of
test.

ITC 2009 will again host its classic poster session which promotes interaction
between the attendee and presenter and provides an opportunity for
late-breaking results to be presented and receive feedback. The poster
session will be held on Tuesday evening, along with the Texas Beer Blast
Reception.

What's New at ITC 2009
A new 'embedded tutorial' track comprised of 4 sessions will be held on day 2
of the conference and offered free of charge to all registered ITC attendees.
The embedded tutorials will cover topics including testing of 3-D chips, new
boundary-scan standards and post-silicon validation.

ITC will also be host to a special Career Track provided by IEEE-USA. The
career track will provide three sessions focused on helping engineers expand
their career prospectus.

A Dynamic Plenary Session Opens the Conference
The formal opening of the conference begins with the plenary session and a
keynote address by Antun Domic, SVP and GM of Synopsis' Implementation Group.
Antun's presentation, Design- and Manufacturing-aware Test Is Our Future, will
discuss how design, manufacturing, and test can join forces and collaborate to
battle the nanometer challenges. ITC's invited speaker, Shekar Borkar, Intel
Fellow, Intel Corporation, will then discuss challenges and potential
solutions across disciplines, such as architecture, system design, circuits &
layout, resiliency, and testing, in his presentation, Design and Test
Challenges for 32 nm and Beyond.

Companies Feature New Products at ITC
As always, the exhibition forms a major part of ITC. Concurrent with the
technical program, an exhibit floor will feature the newest equipment,
software and services from all over the world for solving testing problems. A
"University Booth" will again offer an opportunity for the academic community
to demonstrate device/board/system testing research in areas including design
verification, test, diagnosis and failure analysis.

A Strong Start and Finish for Test Week
ITC Test Week kicks off with 12 tutorials presented by the IEEE Computer
Society's Test Technology Technical Council (TTTC) on the two days prior to
the conference technical program, November 1 and 2. They are geared for
entry-level attendees as well as those wishing to expand their knowledge in a
particular area, and cover such topics as high-speed interface testing,
design-for-manufacturing, silicon debug and diagnosis, statistical screening,
delay test, post-silicon validation, failure mechanisms and high-quality test
methods for nanometer technologies, analog, mixed-signal and RF test, the
economics of test and testability.

Closing out Test Week are three workshops to choose from on design for
reliability and variability, defect- and data-driven testing, and test and
validation of high-speed analog circuits. These workshops provide in-depth
and up-to-the-minute views of work in these important test areas.

About ITC
ITC is sponsored by the Test Technology Council of the IEEE Computer Society
and by the Philadelphia Section of the IEEE. From its beginnings as an
informal gathering of engineers in 1970 at Cherry Hill, New Jersey, ITC has
grown into the Test Week event, with more than a hundred papers, panels, an
exhibition, tutorials, workshops, lecture series sessions, and important
keynote speeches.

ITC is known for a tradition of spirited debates over test issues that
continue during breaks and social gatherings. A multitude of companies choose
ITC to demonstrate major new test products and services in the concurrent
exhibition.

Celebrating its 40th conference year, ITC, the cornerstone of the Test Week
activities, will take place at the Austin Convention Center, Austin, Texas
from November 3-5, 2009. Test Week runs November 1-6, 2009. The Advance
Program and registration information are available on-line at
http://www.itctestweek.org or from the ITC office by telephone at +1
202.973.8665.

ITC gratefully acknowledges its sponsors and corporate supporters.

Sponsors:
IEEE
IEEE Computer Society

Industry Alliance:
GSA

Diamond-level Supporter
Optimal Test

Platinum-level Supporters
Advantest
Mentor Graphics

Gold-level Supporter
TSSI

Silver-level Supporter
Test Advantage Software

SOURCE International Test Conference

Amy Gold, ITC Marketing Chair, +1-212-850-6670, a.gold@advantest.com