Two brothers arrested in Miami after pilot attacked

MIAMI Thu Jul 28, 2011 1:21pm EDT

Related Topics

MIAMI (Reuters) - Two brothers were accused of attacking a pilot at Miami International Airport on Wednesday night after being asked to leave a flight bound for San Francisco.

Police said American Airlines flight 1755 was taxiing to the runway when a flight attendant noticed that Jonathan Baez, 27, had not buckled his seat belt.

The flight attendant told police that she tried to wake Baez up, but he was unresponsive and appeared to be intoxicated or on drugs.

She then notified the pilot, who turned the plane around and asked the man to get off.

The man's brother, 29-year-old Luis Baez, also decided to leave and told the pilot, "When you fly to San Juan, I will have you killed," according to police.

The brothers left, but then came back and Jonathan Baez hit the pilot in the face, according to the arrest report. He also struck a flight attendant in the shoulder as she tried to intervene.

As the pilot followed them off the plane, the brothers started beating him and chased him into the terminal, where they were held by other members of the flight crew and passengers until police arrived, the arrest report said.

(Reporting by Dale K. DuPont; Editing by Colleen Jenkins and Greg McCune)

FILED UNDER:
We welcome comments that advance the story through relevant opinion, anecdotes, links and data. If you see a comment that you believe is irrelevant or inappropriate, you can flag it to our editors by using the report abuse links. Views expressed in the comments do not represent those of Reuters. For more information on our comment policy, see http://blogs.reuters.com/fulldisclosure/2010/09/27/toward-a-more-thoughtful-conversation-on-stories/
Comments (1)
JoeBloski wrote:
“I will have you killed,” sounds like a terrorist threat to me. Welcome to American justice and say bye bye to Puerto Rico for a few decades…

Jul 28, 2011 3:53pm EDT  --  Report as abuse
This discussion is now closed. We welcome comments on our articles for a limited period after their publication.

Full focus