Photo Release -- FEI's New Titan G2 80-200 With ChemiSTEM Technology Enables Atomic...

Photo Release -- FEI's New Titan G2 80-200 With ChemiSTEM Technology Enables
Atomic Spectroscopy of More Elements at Higher Resolution

HILLSBORO, Ore., Aug. 8, 2011 (GLOBE NEWSWIRE) -- FEI Company (Nasdaq:FEIC), a
leading instrumentation company providing electron microscope systems for
applications in research and industry, today announced the release of its
Titan(TM) G2 80-200 with ChemiSTEM(TM) Technology, a new member of the Titan G2
series of S/TEM (scanning / transmission electron microscopes).

Photos accompanying this release are available at:

http://www.globenewswire.com/newsroom/prs/?pkgid=10113

http://www.globenewswire.com/newsroom/prs/?pkgid=10114

"By combining the Titan platform's latest generation of electron optics with the
revolutionary analytical sensitivity of ChemiSTEM Technology, we have created a
microscope which can deliver atomic resolution elemental maps in minutes and
adds new capabilities in addressing our customer's applications in materials
science, chemistry and nanotechnology," said Trisha Rice, vice president and
general manager of FEI's Research Business Unit.

Dr. Paul Kotula of Sandia National Laboratories, said, "Our institute chose the
FEI Titan G2 80-200 due to its innovative combination of the latest in
probe-correction technology and large solid-angle, windowless silicon-drift
x-ray detectors (SDD's). We estimate that we will gain a factor of 50 to 100 in
terms of analytical sensitivity, speed, and spatial resolution combined, over
our existing FEG analytical electron microscope. It is already clear that atomic
resolution x-ray microanalysis is not only possible but practical with this new
microscope. Once the domain only of electron energy loss spectrometry, atomic
resolution microanalysis with x-rays gives us access to more of the periodic
table and the possibility to use existing quantification methods to routinely
analyze many materials at the highest resolution and sensitivity needed." Sandia
National Laboratory will soon receive its Titan G2 80-200 with ChemiSTEM
Technology, the first such system to be installed in North America.

Rice continued, "This new microscope benefits from all the innovations of the
Titan G2 series, including the X-FEG high brightness gun and the next-generation
DCOR probe corrector, achieving spatial resolution of 0.8 Angstroms in STEM and
0.9 Angstroms in TEM, while still maintaining a large, more flexible working
space in the sample area, enabling applications requiring high specimen
tilt-angles. For example, this large tilt-range, when combined with ChemiSTEM
Technology's symmetrically distributed 4-SDD detector architecture permits EDX
Tomography. Thus, for the first time ever 3D elemental composition can be
obtained with standard FIB-prepared lamella samples mounted in standard holders
in an S/TEM."

The Titan G2 80-200's extraordinary analytical speed and sensitivity result from
the FEI proprietary ChemiSTEM Technology, including the X-FEG (an ultra-stable
high-brightness Schottky FEG source), the high sensitivity Super-X EDX detector
system (4 windowless silicon drift detectors integrated deeply into the
objective lens), and high-speed mapping electronics capable of acquiring 100,000
spectra/second. In addition, the high detection efficiency of ChemiSTEM
Technology and the availability of the highest probe currents of any microscope
allow atomic elemental mapping capability to be maintained over the entire
accelerating voltage range of 200 kV down to 80 kV, which can help maximize
signal and reduce sample damage in beam sensitive materials.

"Due to these innovations," Rice added, "this new microscope has the potential
to solve problems in material science research that have previously been
difficult or impossible to address, such as analyzing atomic species polarity
and atomic chemical termination at interfaces, measuring trace elemental
concentrations as low as 0.01 wt%, mapping chemical composition over large
fields of view, and determining elemental composition in three dimensions. We
believe the Titan G2 80-200 with ChemiSTEM Technology will enable breakthrough
results in many key application areas for our customers, such as catalysis,
metallurgy, microelectronics, LEDs, and green energy materials, to name a few."

The Titan G2 80-200 is available for ordering immediately. For more information
about the Titan G2 80-200 with ChemiSTEM Technology, visit:
www.fei.com/chemistem.

About FEI

FEI (Nasdaq:FEIC) is a leading diversified scientific instruments company. It is
a premier provider of electron- and ion-beam microscopes and tools for nanoscale
applications across many industries: industrial and academic materials research,
life sciences, semiconductors, data storage, natural resources and more. With
more than 60 years of technological innovation and leadership, FEI has set the
performance standard in transmission electron microscopes (TEM), scanning
electron microscopes (SEM) and DualBeams(TM), which combine a SEM with a focused
ion beam (FIB). FEI's imaging systems provide 3D characterization, analysis and
modification/prototyping with resolutions down to the sub-Ångström
(one-tenth of a nanometer) level. FEI's NanoPorts in North America, Europe and
Asia provide centers of technical excellence where its world-class community of
customers and specialists collaborate. FEI has over 1900 employees and sales and
service operations in more than 50 countries around the world. More information
can be found at: www.fei.com.

The FEI Company logo is available at
http://www.globenewswire.com/newsroom/prs/?pkgid=6379

FEI Safe Harbor Statement

This news release contains forward-looking statements that include statements
regarding the performance capabilities and benefits of the Titan(TM) G2 80-200
with ChemiSTEM(TM) Technology. Factors that could affect these forward-looking
statements include but are not limited to failure of the product or technology
to perform as expected and achieve anticipated results, unexpected technology
problems and our ability to manufacture, ship and deliver the tools or software
as expected. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other
filings with the U.S. Securities and Exchange Commission for additional
information on these factors and other factors that could cause actual results
to differ materially from the forward-looking statements. FEI assumes no duty to
update forward-looking statements.

CONTACT: Sandy Fewkes, Principal (media contact)
MindWrite Communications, Inc
+1 408 224 4024
sandy@mind-write.com

FEI Company
Fletcher Chamberlin (investors and analysts)
Investor Relations
+1 503 726 7710
fletcher.chamberlin@fei.com