Advantest Introduces T2000 IMS for Low-Cost Testing of Integrated Microcontroller and Smart Card ICs

Wed Nov 7, 2012 3:05am EST

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  TOKYO, Nov 07 (Marketwire) -- 
Leading semiconductor test equipment supplier Advantest Corporation (TSE:
6857) (NYSE: ATE) has introduced its new T2000 Integrated Massive
Parallel test solution (IMS), a massive parallel test system capable of
achieving the lowest cost of test for microcontroller units with
integrated analog and embedded flash memory circuits. The new tester will
be featured in Advantest's exhibit (booth #8C-901 in Hall 8) at the
SEMICON Japan trade show, December 5-7 in Makuhari Messe in the Chiba

    Designed to enable large-scale testing of up to 256 devices
simultaneously, Advantest's new integrated massive parallel test solution
achieves high throughput and fast test times with a parallel efficiency
target of more than 99 percent. The tester's universal pin architecture
internally manages 208 channels of diverse resources to provide optimal

    "With our new T2000 IMS system's highly efficient and massive parallel
production capabilities, we are positioned to capture even more market
share in the cost-sensitive MCU (microcontroller unit) and Smart Card IC
space," said Dr. Toshiyuki Okayasu, executive officer and executive vice
president of the SoC Test Business Group at Advantest Corporation. "The
advantage lies in Advantest's universal pin architecture. Other ATE
companies need several modules and highly complex performance boards to
manage those multiple modules in order to do the same job as our
monolithic IMS module."

    Advantest's design not only lowers the cost of test by simplifying the
design of performance boards, but also reduces recurring manufacturing
costs at production facilities because the universal pin architecture
makes performance boards easier to maintain -- a key performance
attribute for overseas production facilities.

    About Advantest Corporation
 A world-class technology company, Advantest
is the leading producer of automatic test equipment (ATE) for the
semiconductor industry and a premier manufacturer of measuring
instruments used in the design and production of electronic instruments
and systems. Its leading-edge systems and products are integrated into
the most advanced semiconductor production lines in the world. The
company also focuses on R&D for emerging markets that benefit from
advancements in nanotech and terahertz technologies, and has recently
introduced multi-vision metrology scanning electron microscopes essential
to photomask manufacturing, as well as a groundbreaking 3D imaging and
analysis tool. Founded in Tokyo in 1954, Advantest established its first
subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More
information is available at

    All information supplied in this release is correct at the time of
publication, but may be subject to change.

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Advantest Corporation
Shin-Marunouchi Center Building
1-6-2 Marunouchi, Chiyoda-ku, Tokyo 100-0005

Judy Davies 
VP of Global Marketing Communications 
Advantest America Inc.
Tel: +1 408-456-3717 

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