Advantest Introduces T2000 8Gbps Digital Module for High-Speed Testing of SoCs With Serial, Parallel or Memory Interfaces

Tue Nov 27, 2012 3:05am EST

* Reuters is not responsible for the content in this press release.

  TOKYO, Nov 27 (Marketwire) -- 
Leading semiconductor test equipment supplier Advantest Corporation (TSE:
6857) (NYSE: ATE) has introduced its new T2000 8GDM to address the test
requirements of system-on-chip (SoC) devices with high-speed serial,
parallel and memory interfaces such as PCI-Express and double data rate
(DDR) connections. The new module will be featured in Advantest's exhibit
(booth #8C-901 in Hall 8) at the SEMICON Japan trade show, December 5-7
in Makuhari Messe in the Chiba prefecture.

    The T2000 8GDM has the versatility to test a wide range of SoC interfaces
while operating at data rates up to 8Gbps. Key capabilities include clock
and data recovery (CDR), jitter injection, I/O dead band cancellation and
multi-strobe operation. The module is available in an Enhanced
Performance Package (EPP) capable of functional test abstraction (FTA),
which can further shorten cycle times and streamline debugging.

    "With its higher density and performance, our new T2000 8GDM positions us
to capture even more market share in testing complex SoC devices with
high-speed interfaces in multi-time domains," said Dr. Toshiyuki Okayasu,
executive officer and executive vice president of the SoC Test Business
Group at Advantest Corporation. "Both the FTA and EPP features enable
system-level functional testing of these targeted semiconductors."

    Advantest's module and tester designs are not only high performance, but
also reduce test costs and time to market with high-throughput,
multi-user environments and concurrent test capabilities -- all key
performance attributes for overseas production facilities.

    About Advantest Corporation
 A world-class technology company, Advantest
is the leading producer of automatic test equipment (ATE) for the
semiconductor industry and a premier manufacturer of measuring
instruments used in the design and production of electronic instruments
and systems. Its leading-edge systems and products are integrated into
the most advanced semiconductor production lines in the world. The
company also focuses on R&D for emerging markets that benefit from
advancements in nanotech and terahertz technologies, and has recently
introduced multi-vision metrology scanning electron microscopes essential
to photomask manufacturing, as well as a groundbreaking 3D imaging and
analysis tool. Founded in Tokyo in 1954, Advantest established its first
subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More
information is available at www.advantest.com.

    All information supplied in this release is correct at the time of
publication, but may be subject to change.

    

Shin-Marunouchi Center Building
1-6-2 Marunouchi, Chiyoda-ku, Tokyo 100-0005
Contact: 
Judy Davies
VP of Global Marketing Communications (Advantest America Inc.)
Tel: +1 408-456-3717
judy.davies@advantest.com 

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