Aehr Test Systems to Present at Stifel Nicolaus 2013 Technology Conference

Mon Jan 28, 2013 4:01pm EST

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FREMONT, Calif., Jan. 28, 2013 (GLOBE NEWSWIRE) -- Aehr Test Systems (Nasdaq:AEHR), a worldwide
supplier of semiconductor test and burn-in equipment, announced today that the Company's President
and Chief Executive Officer, Gayn Erickson will be presenting at the Stifel Nicolaus 2013
Technology Conference. The conference is being held February 5-7, 2013 at The Ritz-Carlton Hotel
in San Francisco. Aehr Test is scheduled to present at 1:00 p.m. PT on Thursday, February 7, 2013.

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems
for burning-in and testing logic and memory integrated circuits and has an installed base of more
than 2,500 systems worldwide. Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test requirements, capacity needs and
opportunities for Aehr Test products in package and wafer level test. Aehr Test has developed and
introduced several innovative products, including the ABTS TM and FOX TM families of test and
burn-in systems and the DiePak carrier. The ABTS system is used in production and qualification
testing of packaged parts for both low-power and high-power logic as well as all common types of
memory devices. The FOX system is a full wafer contact test and burn-in system used for burn-in
and functional test of complex devices, such as leading-edge memories, digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable,
temporary package that enables IC manufacturers to perform cost-effective final test and burn-in
of bare die. For more information, please visit the Company's website at

CONTACT: Gary Larson
         Chief Financial Officer
         (510) 623-9400 x321

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