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Jordan Valley's QC3 Diffractometer Was Announced as the Winner of CS Industry Metrology Tool Awards 2013

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Mon Mar 4, 2013 6:35am EST

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MIGDAL HA'EMEK, Israel,  March 4, 2013  /PRNewswire/ --



Jordan Valley Semiconductor, a market leader of X-Ray metrology tools, announced
today that its QC3™, a production worthy diffractometer for the compound
semiconductor and LED industries, is the winner of CS Industry 2013 metrology,
test and measurement award.  

"The QC3™  High-Resolution X-Ray Diffractometer is a true leapfrog technology
over the existing X-ray technology within the compound semiconductor market"
said Dr.  Paul Ryan, Corporate VP and UK site manager.

The QC3™  boasts more than an order-of-magnitude improvement in performance
compared to previous systems, with scans taking seconds rather than minutes or
even hours.

The productivity of the QC3™  is further enhanced by the multi-sample stage that
can accommodate up to 20 wafers in a single measurement process, with fully
automated alignment, measurement, analysis and reporting, meaning an operator no
longer needs to manually interpret and record data. The QC3™  uses  Jordan
Valley's  RADS analysis software to provide fast and accurate structural
information from the X-Ray data. The RADS software is recognised as the industry
leader in X-Ray analysis software.

These features of the QC3™  system, coupled with the high data quality and
throughput, leads to faster identification of epi excursions and their root
causes, increasing yield and profit per wafer. Over 50 systems already shipped
and installed in facilities across the world, mainly in  China,  Taiwan  and 
USA.

The CS Industry Awards 2013 recognising success and development along the entire
value chain of the Compound Semiconductor industry from research to completed
device, focusing on the people, processes and products that drive the industry
forward. The CS Industry Awards will remind us what is good about the industry -
the people who drive it with their technical expertise and customer orientated
perspectives. Nominations are open to all companies, individuals and
organisations within the CS industry and voting will occur through Compound
Semiconductor online and print services.

"Jordan Valley  is extremely proud to be named as winner of CS industry award"
says  Isaac Mazor,  Jordan Valley  founder and CEO. "Our growth is a testament
to our entire organization's commitment to technological superiority and to the
wide adoption of our x-ray metrology into the advanced semiconductor
manufacturing processes as well as other emerging markets such as the LED, GaN
and other compound semiconductors."

About Jordan Valley Semiconductors Ltd. http://www.jvsemi.com Jordan Valley
Semiconductors (JVS), the leader in X-ray metrology solutions for the
semiconductor industry, develops manufactures and sells fully automated
metrology tools for advanced technology nodes based on non-contacting and
non-destructive tools.

The company offers the semiconductor industry the most comprehensive portfolio
of advanced metrology tools, based on technologies such as XRR, XRF, XRD, HRXRD
& XRDI (Imaging for defects).

Jordan Valley Semiconductors provides 2 other product to the Compound industry: 
Delta-X  for LED and  QC Velox  that is the next generation HRXRD system for Epi
manufactory.

Jordan Valley's  investors include Clal Industries and Investments Ltd. (TASE:
CII), Intel Capital (NASDAQ: INTC) and Elron Electronics Industries Ltd. (TASE:
ELRN).With headquarters in Migdal Haemek Israel, the company has subsidiaries in
 Durham UK, Austin Texas USA, Dresden,  Germany, Hsin-Chu Taiwan, Suwon Korea
and worldwide representatives network.

For more information:

Web site:  http://www.jvsemi.com

Yuval Agami

Jordan Valley Semiconductors Ltd.

Phone: +97246543666x200

Email:  Yuval.Agami@jordanvalley.com


Dr.  Paul Ryan

Corporate VP, UK site manager

Jordan Valley Semiconductors UK Ltd.

Phone+ 441913324700

Email:  Paul.Ryan@jvsemi.co.uk

SOURCE  Jordan Valley Semicondutor

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