FREMONT, CA, Nov 10 (MARKET WIRE) --
DCG Systems, Inc. today announced major additions to its comprehensive
range of integrated diagnostic tools designed to meet the complex
challenges facing manufacturers of today's advanced 32 nm device
technologies. DCG Systems products will be showcased November 17-18 at
the 35th annual International Symposium for Testing and Failure Analysis
(ISTFA 2009, Booth#204) to be held at the McEnery Convention Center, San
Jose, California.
"DCG has been investing in the future during 2009 by developing and
providing technologies which effectively address the challenge of 32 nm
and beyond," said Dr. Israel Niv, President and CEO of DCG Systems. "DCG's
business grew significantly during this challenging year, and the
introduction of the New Meridian WaferScan and ELITE Systems, as well as
the Laser Voltage Imaging option on our existing systems, represents our
continuing commitment to provide technologies which our customers require
in order to be successful."
Meridian(TM) WaferScan is DCG Systems' newest wafer yield enhancement
instrument to incorporate the successful Meridian-IV platform with a
semi-automatic full 300mm wafer prober. The WaferScan allows Meridian-IV's
emission analysis capability to be applied to any die on the wafer,
providing an effective means to analyze systematic or "soft" parametric
defects whose characteristics may vary across the wafer. Meridian
WaferScan docks with the production tester and probe card.
DCG Systems' new ELITE(TM) lock-in IR thermography system provides an
exciting new real-time capability for solving issues such as line shorts,
ESD defects, oxide damage and device latch-ups. Of particular significance
is the ability of ELITE to locate thermal defects in three dimensions,
providing the ability to image through the device package and pinpoint
defects within stacked-die.
Laser Voltage Imaging(TM) (LVI) capability is now an optional addition to
DCG's Meridian-IV and Ruby(TM) products. This capability shows the
physical locations of transistors that are active at a specific
frequency, and may be used to determine the precise locations to obtain
the best signal strength for waveform measurements. The addition of LVI
also provides a Continuous Wave Laser Voltage Probing(TM) (CW-LVP)(TM)
signal acquisition capability. The CW-LVP's lower-bandwidth complements
the Ruby's high-bandwidth (in excess of 20 GHz) capability.
About DCG Systems
DCG Systems, Inc., a privately held company headquartered in Fremont,
California, is the leading provider of semiconductors debug and
characterization solutions for the global semiconductor industry. With a
commitment to applying innovative technology to improve time to yield and
time to market, DCG Systems delivers competitive cost and performance
advantages to integrated device manufacturers (IDMs), wafer foundries and
fabless chip companies worldwide. DCG Systems is comprised of the former
Schlumberger/NPTest Probe Systems division, Optonics Inc. and Hypervision
Inc., with an installed base of over 700 systems worldwide. For more
information on DCG Systems, please visit http://www.dcgsystems.com.
Contact:
Roger Nicholson
Marketing Communications
roger_nicholson@dcgsystems.com
Copyright 2009, Market Wire, All rights reserved.
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