IEEE Approves Standard for On-Chip Scan Compression

Move Ratifies Accellera's Open Compression Interface Standard
PISCATAWAY, N.J.--(Business Wire)--
The IEEE has approved a new standard, IEEE 1450.6.1, " Standard for Describing
On-Chip Scan Compression."

This important standard for Integrated Circuit (IC) test is also known as the
Open Compression Interface (OCI). It was initially created within the Accellera
standards-setting organization and was transferred to the IEEE following
Accellera's ratification.

OCI defines how information is passed from scan insertion to pattern generation
and from pattern generation to diagnosis, allowing tools from different vendors
to be used regardless of what on-chip scan compression logic is used. It
describes on-chip scan compression structures, operation, and connectivity which
promote EDA tool interoperability for pattern generation and diagnosis.

"The approval of IEEE 1450.6.1 opens up opportunities for chip manufacturers,
design automation and the makers of automated test equipment," says Bruce D.
Cory, chair for the IEEE working group which shepherded the standard. "After
on-chip scan compression was developed, each vendor had their own, different set
of methods to pass necessary information from scan insertion to pattern
generation and from pattern generation to diagnosis. This created significant
competitive barriers. Now this standard allows the test industry to use a
variety of tools, regardless of what on-chip scan compression logic was used."

"Electronic design industry participants worked together as part of our
Accellera Technical SubCommittee to improve design and test tool
interoperability, and to develop and achieve approval for our newest IEEE
standard, IEEE 1450.6.1, which helps improve and reduce the costs of on-chip
testability and manufacturing," adds Shrenik Mehta, Accellera chair. "The new
standard helps make it possible to test silicon even if an IC design or its
embedded intellectual property was developed using different design and test
software."

For more information on Accellera`s standards, please visit www.accellera.org.

IEEE 1450.6.1 was sponsored by the Test Technology Committee of the IEEE
Computer Society.

About the IEEE Standards Association

The IEEE Standards Association, a globally recognized standards-setting body,
develops consensus standards through an open process that engages industry and
brings together a broad stakeholder community. IEEE standards set specifications
and best practices based on current scientific and technological knowledge. The
IEEE-SA has a portfolio of over 900 active standards and more than 400 standards
under development. For information on the IEEE-SA, see:
http://standards.ieee.org.

About IEEE

IEEE (Institute of Electrical and Electronics Engineers, Inc.), the world's
largest technical professional society, is commemorating its 125th anniversary
in 2009 by "Celebrating 125 Years of Engineering the Future" around the globe.
Through its more than 375,000 members in 160 countries, IEEE is a leading
authority on a wide variety of areas ranging from aerospace systems, computers
and telecommunications to biomedical engineering, electric power and consumer
electronics. Dedicated to the advancement of technology, IEEE publishes 30
percent of the world's literature in the electrical and electronics engineering
and computer science fields, and has developed over 900 active industry
standards. The organization annually sponsors more than 850 conferences
worldwide. Additional information about IEEE can be found at
http://www.ieee.org.

IEEE
Karen McCabe, +1-732-562-3824
IEEE-SA Marketing Director
k.mccabe@ieee.org

Copyright Business Wire 2009