Key Developments For Camtek Ltd

Camtek Ltd (CAMT.O) (Consolidated Issue listed on NASDAQ Global Market)
As of  27 Nov 2009
1.30USD
Price Change
-0.04
Percent Change
-2.99%
 
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Camtek Ltd. Announces Closing of Acquisition of Semiconductor Engineering Laboratories Ltd
Thursday, 12 Nov 2009 01:23pm EST 

Camtek Ltd. announced that further to its announcement on September 24, 2009, regarding the signing of an agreement for the acquisition of the entire share capital of SELA - Semiconductor Engineering Laboratories Ltd. (SELA), it has completed the acquisition of Sela. In consideration for the shares, Camtek will pay to SELA's shareholders future payments in the aggregate amount of up to $9.5 million, contingent upon SELA's revenues. SELA is engaged in the development, manufacturing and marketing of automated SEM (Scanning Electron Microscope) and TEM (Transmission Electron Microscope) sample preparation equipment, primarily for the semiconductor industry. 

 
Camtek Ltd. Announces Signing of Agreement for Acquisition of Semiconductor Engineering Laboratories LTD.
Thursday, 24 Sep 2009 10:47am EDT 

Camtek Ltd. announced the signing of an agreement to acquire the entire share capital of SELA- Semiconductor Engineering Laboratories Ltd. (SELA). SELA is engaged in the development, manufacturing and marketing of automated SEM (Scanning Electron Microscope) and TEM (Transmission Electron Microscope) sample preparation equipment, primarily for the semiconductor industry. As consideration for the shares, Camtek will pay to SELA's shareholders contingent future payments in the aggregate amount of up to $9.5 million, based on SELA's revenues. The transaction is expected to be completed during the fourth quarter of 2009. 

 
Court Judgment Favors Rudolph Technologies, Inc. Patent Infringement Case; Permanent Injunction Entered Against Camtek Ltd. Prohibits Sale Of Falcon Systems In USA
Wednesday, 9 Sep 2009 08:02am EDT 

Rudolph Technologies, Inc. announced that the United States District Court in Minneapolis has issued a permanent injunction against Camtek Ltd., which bars Camtek from selling its Falcon line of inspection tools in the United States. The court also granted Rudolph post-trial interest on the lost profits damages awarded by the jury. Rudolph`s U.S. Patent No. 6,826,298 covers optical inspection of semiconductors using strobing illumination. This technology is embodied in Rudolph`s NSX and AXi Inspection Systems. Specifically, the August 28, 2009 injunction places significant obligations on Camtek, including; Camtek is prohibited from making, using, selling and offering to sell any of its Falcon machines in the U.S.; Camtek is prohibited from communicating with third parties in the U.S. for the purposes of selling or offering to sell Falcon machines that are to be located or used in the U.S. or internationally; Camtek must state in marketing or advertising materials that the Falcon machine is not for sale or use in the U.S.; Camtek cannot substantially improve or change the Falcon machines sold and delivered in the U.S. prior to March 5, 2009 (i.e. substantial software or hardware upgrades). Operator training for these systems is similarly prohibited; Camtek is also ordered to identify and secure all Falcon machines not yet shipped to U.S. customers that are currently located in the U.S. Award of damages and interest (to Rudolph) in the amount of $8.0 million. 

 
Camtek Ltd. Comments On Q3 2009 Revenue Outlook
Wednesday, 12 Aug 2009 06:13am EDT 

Camtek Ltd. announced that for third quarter of 2009, it expects revenues to be slightly higher than those of the second quarter of 2009. 

 
Magma Design Automation, Inc. And Camtek Ltd. Teams To Enhance Yield Of Advanced Semiconductors
Tuesday, 14 Jul 2009 04:01pm EDT 

Magma Design Automation, Inc. announced that Camtek Ltd. has integrated Magma's YieldManager software into Falcon, Camtek's flagship line of automated wafer inspection and metrology systems, and will sell it as an option. The combination of Camtek's automated inspection platforms and Magma's YieldManager allows fab engineers to more effectively analyze inline defect data and yield data to accelerate root cause identification of yield problems, ensuring higher yields and reducing manufacturing costs. 

 
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