Key Developments For Nanometrics Inc

Nanometrics Inc (NANO.O) (Consolidated Issue listed on NASDAQ Global Market)
As of  27 Nov 2009
11.10USD
Price Change
-0.52
Percent Change
-4.48%
 
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Nanometrics, Inc. Receives Multiple Metrology Orders For High Brightness LEDs
Thursday, 12 Nov 2009 09:00pm EST 

Nanometrics, Inc. announced multiple orders from new and existing HB-LED customers for RPMBlue and IVS185 metrology systems, which will be used for photoluminescence (PL) mapping and critical dimension and overlay control, respectively. These systems are scheduled to be delivered and qualified in the fourth quarter of this year. 

 
Nanometrics, Inc. Receives Multiple System Order For Atlas XP and NanoGen From Semiconductor Manufacturer
Thursday, 20 Aug 2009 09:00am EDT 

Nanometrics, Inc. announced that is has received an order for multiple Atlas XP metrology systems equipped with NanoCD capability. The systems are expected to be qualified in the third quarter of this year at a semiconductor manufacturer. The systems will be installed with Nanometrics' scalable NanoGen cluster computing solutions to enable analysis of the most critical and complex process steps in an advanced technology node, supporting both film thickness and optical critical dimension (OCD) metrology. 

 
Nanometrics, Inc. Announces Multiple System Order For Caliper Mosaic Overlay Metrology Systems
Monday, 3 Aug 2009 09:01am EDT 

Nanometrics, Inc. announced a multiple system order for its Caliper Mosaic overlay metrology system. The systems will be used in production running in conjunction with the Blossom overlay target technology and are expected to be delivered and qualified in the third quarter of 2009. 

 
Nanometrics, Inc. Announces Metrology System For Solar PV Applications
Wednesday, 22 Jul 2009 04:06pm EDT 

Nanometrics, Inc. announced the launch of its TSM integrated metrology system. 

 
Nanometrics, Inc. Receives Multiple System Orders For High Brightness LED Metrology
Wednesday, 8 Jul 2009 09:01am EDT 

Nanometrics, Inc. announced orders for one VerteX and multiple RPMBlue photoluminescence (PL) mapping metrology systems. The VerteX system is expected to be qualified into a new HB-LED development line, and the RPMBlue systems are expected to be qualified into the high-volume manufacturing line of a different customer. All systems are expected to be qualified in the third quarter of this year. 

 
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