People: AEHR Test Systems (AEHR.O)
19 Dec 2014
Mr. Kunio Sano is President of Aehr Test Systems, Japan K.K., a subsidiary of Aehr Test Systems. He joined the Company as Vice President, Aehr Test Systems Japan K.K., the Company’s subsidiary in Japan, in June 1998. From 1991 to 1998, he served as Manager of Development Engineering Department at Tokyo Electron Yamanashi Limited, a worldwide semiconductor equipment manufacturer. Mr. Sano received a B.S.E.E. from Sagami Institute of Technology in Kanagawa, Japan.
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