December 19, 2018 / 12:51 AM / 9 months ago

Judge rejects Texas company's chip testing patent on 'doing math'

A federal judge has invalidated a Texas company’s patent on a method of testing semiconductor chips using computerized statistical analysis, handing a victory to semiconductor companies Maxim Integrated Products Inc and Vishay Intertechnology Inc.

U.S. District Judge Colm Connolly in Delaware ruled on Tuesday that In-Depth Test LLC’s patent was invalid because it essentially covered the abstract idea of “doing math,” granting judgment on the pleadings in a pair of infringement lawsuits In-Depth filed against Maxim and Vishay in 2014.

To read the full story on Westlaw Practitioner Insights, click here:

0 : 0
  • narrow-browser-and-phone
  • medium-browser-and-portrait-tablet
  • landscape-tablet
  • medium-wide-browser
  • wide-browser-and-larger
  • medium-browser-and-landscape-tablet
  • medium-wide-browser-and-larger
  • above-phone
  • portrait-tablet-and-above
  • above-portrait-tablet
  • landscape-tablet-and-above
  • landscape-tablet-and-medium-wide-browser
  • portrait-tablet-and-below
  • landscape-tablet-and-below