Profile: Nova Measuring Instruments Ltd (NVMI.O)
16 Nov 2018
Nova Measuring Instruments Ltd., incorporated on May 17, 1993, provides metrology solutions for the semiconductor manufacturing industry. The Company offers in-line Optical and x-ray stand-alone metrology systems, as well as integrated optical metrology systems, which are attached directly to wafer fabrication process equipment. Its metrology systems measure various film thickness and composition properties, as well as critical-dimension (CD) variables during various front-end and back-end of line steps in the semiconductor wafer fabrication process. Its product portfolio includes a set of in-situ, integrated and stand-alone metrology platforms suited for dimensional, films and material metrology measurements for process control across multiple semiconductor manufacturing process steps, including lithography, Etch, Chemical Mechanical Planarization (CMP) and deposition.
The Company's products include NovaScan 2040, NovaScan 3090Next, Nova i500, Nova T500, Nova T600, Nova V2600 TSV metrology system, NovaMars, Nova Hybrid Metrology solution, Nova Fleet Management, NovaHPC (High Power Computer), VeraFlex II, VeraFlex III XF and QED. The NovaScan 2040 is an integrated thickness monitoring system with spectral range, responding to the needs of the industry for emerging chemical mechanical polishing applications of thin films and complex layer stacks. The NovaScan 3090Next is available as integrated metrology and as stand-alone metrology systems for both thin film and Optical CD (scatterometry) applications. The Nova i500 integrated metrology product family delivers advanced metrology with high throughput and tool matching performance. The Nova T600 features multi-channel reflectometry configuration.
The Nova V2600 TSV metrology system allows measurement of critical Through Silicon Via (TSV) features, such as side-wall angle, bottom diameter and bottom curvature. NovaMars is a scatterometry modeling and application development software tool enabling complex two-dimensional (2D), three dimensional (3D) and in-die measurements, as well as Real Time Regression (RTR) capabilities. Nova Hybrid Metrology solution is part of its metrology approach that utilizes different sources of information. Nova Fleet Management is its solution for managing large fleets of metrology tools and is designed to address the needs and working methodologies of Metrology and Process Engineers in the fab. NovaHPC (High Power Computer) supports the NovaMars Application Development Tool. The VeraFlex II is a production-proven platform to use x-ray photoelectron spectroscopy (XPS), a materials analysis technology. QED is the Offline Advanced Data Analysis and Recipe Creation and Maintenance System that supports VeraFlex II and VeraFlex III XF.
The Company competes with Nanometrics Inc., KLA-Tencor Corp., Rudolph Technologies, Inc., ASML Holdings N.V., Applied Materials Inc. and Lam Research Inc.
Nova Measuring Instruments Ltd
Weizmann Science Park
P.O. Box 266